Goldsmith, C. C.; Gilfrich, John V.; Bowen, D. K.; Huang, Ting C.; Jenkins, Ron; Noyan, I. Cev; Smith, Deane K.; Predecki, Paul K.; Zaitz, Mary Ann; Snyder, Robert L.
DDC: Analytical chemistry
LCC: Technology » Technology (General) » Exhibitions » Special exhibitions (TA404.6QD450-882)
ISBN-13: 9780306458033 | ISBN-10: 0306458039
Advances in X-Ray Analysis
Springer
€ 292,72
Leverbaar
Proceedings of the July 1995 conference. One hundred papers describe important work in X-ray diffraction (XRD), reflectivity, and fluorescence. Topics include the evolution of X-ray instrumentation, techniques, and software; conditioning of X-ray beams and other developments in X-ray instrumentation
Gebonden | 926 pagina's | Engels
Verschenen in 1998
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