Bardell, Paul H.; Savir, J.; McAnney, W. H.
NUR: Technische wetenschappen algemeen
ISBN-13: 9780471624639 | ISBN-10: 0471624632
Built In Test for VLSI : Pseudorandom Techniques
Groothandel - BESTEL
€ 205,95
Leverbaar
This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing.
Gebonden | 368 pagina's | Engels
1e druk | Verschenen in 1987
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