Rein, Stefan

Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications

Groothandel - BESTEL
€ 294,95

Leverbaar

PLifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombinatio

Gebonden | 520 pagina's | Engels
1e druk | Verschenen in 2005
Rubriek:

  • NUR: Technische wetenschappen algemeen
  • ISBN-13: 9783540253037 | ISBN-10: 3540253033