Rein, Stefan
NUR: Technische wetenschappen algemeen
ISBN-13: 9783540253037 | ISBN-10: 3540253033
Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications
Groothandel - BESTEL
€ 294,95
Leverbaar
PLifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombinatio
Gebonden | 520 pagina's | Engels
1e druk | Verschenen in 2005
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