Masashi Horiguchi,
Kiyoo Itoh
Springer New York
2011e druk, 2011
9781441979575
Nanoscale Memory Repair
Specificaties
Gebonden, 218 blz.
|
Engels
Springer New York |
2011e druk, 2011
ISBN13: 9781441979575
Rubricering
Juridisch
:
Onderdeel van serie
Integrated Circuits and Systems
Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.
Specificaties
ISBN13:9781441979575
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:218
Uitgever:Springer New York
Druk:2011
Inhoudsopgave
<p>An Introduction to Repair Techniques: Basics of Redundancy.- Basics of Error Checking and Correction.- Comparison between Redundancy and ECC.- Repairs of Logic Circuits.- Redundancy: Models of Fault Distribution.- Yield Improvement through Redundancy.- Replacement Schemes.- Intra-Subarray Replacement.- Inter-Subarray Replacement.- Subarray Replacement.- Devices for Storing Addresses.- Testing for Redundancy.- Error Checking and Correction: Linear Algebra and Linear Codes.- Galois Field.- Error-Correcting Codes.- Coding and Decoding Circuits.- Theoretical Reduction in Soft-Error and Hard-Error Rates.- Application of ECC.- Testing for ECC.- Synergistic Effect of Redundancy and ECC: Repair of Bit Faults using Synergistic Effect.- Application of Synergistic Effect.</p>
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