Contactless VLSI Measurement and Testing Techniques

Name: Contactless VLSI Measurement and Testing Techniques
Author: Selahattin Sayil

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Gebonden, blz. | Engels

Springer International Publishing | e druk, 2017

ISBN13: 9783319696720

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Springer International Publishing e druk, 2017 9783319696720

120,99

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This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing. The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing. The techniques described in this book address the increasing demands for internal access of the logic state of a node within a chip under test.

Specificaties

ISBN13:9783319696720

Taal:Engels

Bindwijze:gebonden

Uitgever:Springer International Publishing

Inhoudsopgave

<p>1. Conventional Test Methods. – 2. Testability Design.- 3. Other Techniques Based on the Contacting Probe.- 4. Contactless Testing.- 5. Electron-Beam and Photoemission Probing.- 6. Electro Optic Sampling and Charge Density Probe.- 7. Electric Force Microscope, Capacitive Coupling and Scanning Magneto-Resistive Probe.- 8. Probing Techniques Based on Light Emission from Chip.- 9. All Silicon Optical Technology for Contactless Testing of Integrated Circuits.- 10. Comparison of Contactless Testing Methodologies.</p>

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