Advances in X-Ray Analysis

I. Characterization of Epitaxial Thin Films and Crystal Defects by X-Ray Diffraction.- High Resolution X-Ray Diffraction for the Characterization of Semiconducting Materials.- X-Ray Topography of Surface Layers and Epitaxial Films.- Stresses in Thin Films.- Deformation, Recovery and Stress Corrosion Cracking of Nickel-Base Alloy 600 by X-Ray Rocking-Curve Measurements.- X-Ray Characterisation of Residual Surface Strains after Polishing of Silicon Wafers.- Measurement of Relaxation in Strained Layer Semiconductor Structures..- Characterization of Structural Inhomogeneities in GaAs/AlGaAs Superlattices.- X-Ray Diffraction Analysis of SiGe/Si Superlattices.- High Resolution Measurement of Surface Misorientation in Single Crystal Wafers.- II. XRD Characterization of Polycrystalline Thin Films.- Surface and Ultra-Thin Film Characterization by Grazing-Incidence Asymmetric Bragg Diffraction.- Study of Thin Films and Multilayers using Energy-Dispersive Diffraction of Synchrotron Radiation.- Effects of Refraction and Reflection on Analysis of Thin Films by the Grazing-Incidence X-Ray Diffraction Method.- Enhanced Range of Measurable Thickness of Thin Crystalline Layers Using ?/2? Decoupled Powder X-Ray Diffraction.- X-Ray Diffraction of Plasma Nitrided Ti-6A1-4V.- A Comparative Study of Stress Determination Techniques in Polycrystalline Thin Films.- X-Ray Line Broadening Analysis of T1-Superconducting Films.- Stress Analysis of Thin-Film SmS using a Seemann-Bohlin Diffractometer.- Residual Stresses and Differential Deformation of Electroplated Structures.- X-Ray Residual Stress Analysis of Zn-Ni Alloy Electroplating Layers.- XRD Characterization of Titanium/Copper Thin Films Heat Treated in Vacuum and Hydrogen.- III. X-Ray Spectrometric Characterization of Thin Films.- Characterization of Thin Films Using XRF.- The Determination of Elemental Composition, Thickness and Crystalline Phases in Single and Multi-Layer Thin Films.- Near-Surface Chemical Characterization Using Grazing Incidence X-Ray Fluorescence.- Basic Studies of Multi-Layer Thin Film Analysis Using Fundamental Parameter Method.- Application of Multi-Layer Thin Film Analysis by X-Ray Spectrometry Using the Fundamental Parameter Method.- Fundamental Parameter-Based X-Ray Fluorescence Analysis of Thin and Multilayer Samples.- Non-Destructive Chemical-State Analysis of Thin Films and Surface Layers (1–1000 nm) by Low-Energy Electron-Induced X-Ray Spectroscopy (LEEIXS).- IV. Analysis of Digital Diffraction Data Including Rietveld.- Structure Refinements in Chemistry and Physics. A Comparative Study Using the Rietveld and the Two-Step Method.- X-Ray Powder Diffraction QPA by Rietveld Pattern-Fitting — Scope and Limitations.- Application of Position Sensitive Detectors for Neutron Diffraction Texture Analysis of Hematite Ore.- Problems in the Derivation of d-Values from Experimental Digital XRD Patterns.- Derivation of d-Values from Digitized X-Ray and Synchrotron Diffraction Data.- The Optimization of Step Size While Collecting a Digitized Diffraction Pattern at a Constant Total Scan Time.- XRD Acquisition Parameters for Detection of Weak Peaks.- V. X-Ray Stress Analysis.- X-Ray Examination of Fracture Surfaces of Silicon Nitride Ceramics.- X-Ray Residual Stress Measurement on Fracture Surface of Stress Corrosion Cracking.- Time-Resolved X-Ray Stress Measurement During Cyclic Loading.- Determination of Rolling Contact Stress Distribution by X-Ray Diffraction.- Residual Stress Distribution of Ceramic-Metal Joint.- Diffraction Plane Dependence of X-Ray Elastic Constants of Alumina.- VI. Determination of Crystallite Size and Strain.- The Importance of Consistent 1/d Scans in Determining Size and Strain by Powder Diffraction Profile Analysis.- The Comparison of Several Standard Materials and Techniques for the Warren-Averbach Determination of Microstructure Characteristics of Calcium Hydroxide Sorbent Materials.- The Use of 2-D Detector Utilizing Laser-Stimulated Luminescence for X-Ray Diffraction Studies on Mechanical Behaviour of Materials.- Correction of X-Ray Diffraction Profiles Measured by PSPC System.- Strain and Particle Size of Palladium Metal Powders by Time-of-Flight Neutron Diffraction.- Numerical Resolution Enhancement of X-Ray Diffraction Patterns.- VII. Phase Identification, Structural and Quantitative Analysis by Diffraction.- Standard Database Format for the Dissemination and Storage of Diffraction Data — Task Group Progress Report on JCAMP-DX.- X-Ray Analysis of the Structure of Wholly Aromatic Copolyamides and Copolyester Carbonates.- Polymorphism in Syndiotactic Polystyrene.- Phase Diagram Studies on Neopentylglycol and Pentaerythritol-Thermal Energy Storage Materials.- Crystal Chemistry and Phase Equilibria of the BaO-R2O3-CuO Systems.- Measurement of the Phase Composition of Partially Stabilized Zirconia (PSZ) Test Parts by X-Ray Powder Diffraction.- X-Ray Mass Absorption Coefficients: Measurements and Uses in the Quantitative Diffraction Analysis of Pyrite in Coals.- An Overview of the Use of XRD as a Tool in the Total Analysis of Powdered Household Laundry Detergents.- The Determination of Quartz in Perlite by X-Ray Diffraction.- VIII. X-Ray Spectrometry Data Analysis.- The Concept of Pathlength Distributions Applied to Fundamental Parameter Approach.- A Versatile Fundamental Alphas Program for Use with Either Tube or Secondary Target Excitation.- Absorption Corrections via Backscattered Radiation in Polychromatic Excitation Energy-Dispersive X-Ray Fluorescence Spectrometry..- Intensity and Distribution of Background X-Rays in Wavelength Dispersive Spectrometry III.- An Artificial Intelligence System for XRF Data on a Personal Computer.- SPC: What is It and Why should You Use It in Your X-Ray Analytical Laboratory?.- SPC Analysis of Optimal Strategies for Restandardization of X-Ray Fluorescence Analyses.- Analytical Errors from Electronic Instability in the Counting Chain of a Wavelength-Dispersive XRF Spectrometer.- Corrections for the Effect of Scattering on XRF Intensity.- XRFPC: A Program and Data Base for XRF Computations.- Theoretical Estimation of the Fourth-Order XRF Intensity.- IX. XRF Instrumentation.- TXRF Spectrometer for Trace Element Detection.- A Compact On-Line XRF Analyzer for Chemical and Petrochemical Processes..- XRF Macroprobe Analysis of Geologic Materials.- Qualitative XRF Analysis with Pattern Recognition.- Design of High Performance Soft X-Ray Windows.- X-Ray Capillary Microbeam Spectrometer.- X. XRF Techniques for Hazardous Wastes and Other Applications.- The Use of Field-Portable X-Ray Fluorescence Technology in the Hazardous Waste Industry.- XRF Technique as a Method of Choice for On-Site Analysis of Soil Contaminants and Waste Material.- Application of Field Mobile EDXRF Analysis to Contaminated Soil Characterization.- Screening of Hazardous Waste with an Energy Dispersive X-Ray Fluorescence Spectrometer.- X-Ray Fluorescence Analysis of Trace Metals in the Annual Growth Layers of Freshwater Mussel Shells.- Application of PIXE Method for Environmental Protection in Poland.- Microvolume Analysis of Fly Ash by Synchrotron Radiation X-Ray Fluorescence (SRXRF) and Electron Microprobe X-Ray Microanalysis (EPXMA).- X-Ray Fluorescence Analysis of Zeolites for the Determination of Silica: Alumina Ratio and Soda: Alumina Ratio.- Alumina Characterization by XRF.- Author Index.