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Atom-Probe Tomography

The Local Electrode Atom Probe

Specificaties
Gebonden, 423 blz. | Engels
Springer US | 2014e druk, 2014
ISBN13: 9781489974297
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Springer US 2014e druk, 2014 9781489974297
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Samenvatting

Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.

Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new state-of-the-art instrument – is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.

Specificaties

ISBN13:9781489974297
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:423
Uitgever:Springer US
Druk:2014

Inhoudsopgave

<p>Introduction to Atom Probe Tomography.- Introduction to the Physics of Field Ion Emitters.- Field Evaporation and Related Topics.- The Art of Specimen Preparation.- The Local Electrode Atom Probe.- Data Reconstruction.- Data Analysis.- Appendices.</p>

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        Atom-Probe Tomography