Studying Atomic Dynamics with Coherent X-rays

Specificaties
Paperback, 98 blz. | Engels
Springer Berlin Heidelberg | 2012e druk, 2014
ISBN13: 9783642436222
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Springer Berlin Heidelberg 2012e druk, 2014 9783642436222
Onderdeel van serie Springer Theses
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Samenvatting

Diffusion in solids at moderate temperatures is a well-known phenomenon.  However, direct experimental evidence about the responsible atomic-scale mechanisms has been scarce, due to difficulties in probing the relevant length- and time-scales. The present thesis deals with the application of X-ray Photon Correlation Spectroscopy (XPCS) for answering such questions. This is an established method for the study of slow dynamics on length-scales of a few nanometres. The scattered intensity in the diffuse regime, i.e. corresponding to atomic distances, is very low, however, and so it has so far been considered impossible to use XPCS for this problem.

Threefold progress is reported in this work: It proposes a number of systems selected for high diffuse intensity, it optimizes the photon detection and data evaluation procedures, and it establishes theoretical models for interpretating the results. Together these advances allowed the first successful atomic-scale XPCS experiment, which elucidated the role of preferred configurations for atomic jumps in a copper-gold alloy.

The growth in available coherent X-ray intensity together with next-generation X-ray sources will open up a wide field of application for this new method.

Specificaties

ISBN13:9783642436222
Taal:Engels
Bindwijze:paperback
Aantal pagina's:98
Uitgever:Springer Berlin Heidelberg
Druk:2012

Inhoudsopgave

Introduction.- Theory.- Linking Theory to Experiments.- Characteristics of Diffusion in Selected Systems.- Data Evaluation.- Considerations Concerning the Experiment.- Experimental Results.- Outlook.- Appendix.

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        Studying Atomic Dynamics with Coherent X-rays